TEM Sample Preparation Technician

This role involves performing Transmission Electron Microscopy (TEM) analysis and sample preparation using Focused Ion Beam (FIB) microscopy to support semiconductor failure analysis and characterization. The position requires working independently on night shifts to troubleshoot sample preparation challenges, conduct precision milling, and ensure samples meet quality standards. The ideal candidate will have hands-on experience with TEM and FIB systems, strong problem-solving skills, and the ability to communicate effectively with engineering teams.